トップに戻るUtilization of high speed x‐ray topography for determining diffusion coefficients of point defects in nearly perfect crystals
T. Hondoh, A. Goto, R. Hoshi, T. Ono, H. Anzai, R. Kawase, P. Pimienta, S. Mae1989年Review of Scientific InstrumentsIF 1.6出版社 