Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm

Thanh Hung Dinh, Yoshiki Kondo, Toshiki Tamura, Yuichi Ono, Hiroyuki Hara, Hiroki Oikawa, Yoichi Yamamoto, Masahiko Ishino, Masaharu Nishikino, Tetsuya Makimura, Padraig Dunne, Gerry O’Sullivan, Shigeru Ohta, Ken Kitano, Takeo Ejima, Tadashi Hatano, Takeshi Higashiguchi2016年Review of Scientific InstrumentsIF 1.6 出版社