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System-on-chip approach microwave imaging reflectometer on DIII-D tokamak

Y. Zhu, Y. Chen, J.-H. Yu, C. Domier, G. Yu, X. Liu, G. Kramer, Y. Ren, A. Diallo, N. C. Luhmann, Jr., X. Li2022年Review of Scientific InstrumentsIF 1.6 出版社

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diii-d高精度(タイトル一致)

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