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The influence of impurities on ion temperature measured by a retarding field analyzer

J Shao, Hai Liu, Yuhong Xu, Jie Huang, Haifeng Liu, Xianqu Wang, Xin Zhang, Jun Cheng, Changjian Tang2020年Plasma Physics and Controlled FusionIF 2.2出版社

The retarding field analyzer (RFA) is considered to be one of the most effective tools to measure ion temperature (Ti) in the plasma boundary. However, there are some inaccuracies in the measured Ti by RFA caused by impurities in the plasma. In this paper, the influence of impurities on the measured Ti by RFA have been analyzed in hydrogen isotope plasmas with both low-Z and high-Z impurities. The analytical results show that Ti is underestimated in H+ (also D+ and T+) plasma when the fuel ion charge is taken as the charge number and the analyzed Ti in H+ plasma are all larger than that in D+ and T+ plasmas, exhibiting the isotope effect. With the concentration of low-Z impurity (ηl) increasing, the analyzed Ti decreases and is underestimated by about 20% with ηl ∼ 12%. Following a comparison of different charge numbers and masses of low-Z impurities, it is found that larger charge numbers and smaller masses of low-Z impurities lead to greater underestimation of the analyzed Ti. High-Z impurities make almost no impact on the Ti, due to their small current contribution. Moreover, the Ti is measured by RFA and edge rotational diagnostic (ERD) systems through experiments. The results show good agreement with the analytical evaluations.

日本語訳

遅延電場分析器(RFA)は、プラズマ境界におけるイオン温度(Ti)を測定するための最も効果的なツールの一つと考えられている。しかし、プラズマ中の不純物によってRFAによるTi測定値にはいくつかの不正確さが生じる。本論文では、低Z不純物および高Z不純物を含む水素同位体プラズマにおいて、RFAによるTi測定値に対する不純物の影響を解析した。解析結果によると、燃料イオンの電荷数を電荷数として用いた場合、H+(およびD+、T+)プラズマにおいてTiは過小評価され、H+プラズマにおける解析TiはすべてD+およびT+プラズマにおける値よりも大きく、同位体効果を示す。低Z不純物濃度(ηl)が増加すると、解析Tiは減少し、ηl〜12%で約20%の過小評価となる。異なる電荷数および質量を有する低Z不純物の比較から、電荷数が大きく質量が小さい低Z不純物ほど、解析Tiの過小評価が大きくなることが明らかになった。高Z不純物は、その電流寄与が小さいため、Tiにほとんど影響を及ぼさない。さらに、RFAおよびエッジ回転診断(ERD)システムによるTi測定を実験的に行い、その結果は解析的評価と良好な一致を示した。

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