Experimental research on the electron cyclotron wave (ECW) pre-ionization and assisted start-up was carried out systematically for the first time in EAST tokamak, which is a superconducting device with ITER-like full metal wall. Breakdown and plasma initiation at low toroidal electric fields (<0.3 V m−1) with ECW pre-ionization and startup assistance has been demonstrated. Also, the parameter domain of breakdown is significantly extended towards higher prefill gas pressure. The effect of ECW injection timing, power, toroidal injection angle on breakdown were also investigated. Injecting ECW earlier leads to an earlier breakdown and a higher plasma current ramp rate. The electron cyclotron heating (ECH) power threshold for breakdown in EAST is approximately 0.4 MW. In the range of ECH power tested in this work, higher ECH power is advantageous for achieving earlier and faster breakdown. Furthermore, the breakdown with radial ECW injection occurs earlier compared with oblique injections (co-current and counter-current). During the ECW-assisted startup, the process of burn-through is prolonged by the higher pre-filled gas pressure even though it enhances the ease of breakdown. In addition, compared to the low hybrid wave assistance, the ECW assistance has an effect in averting the generation of runaway electrons and improving the safety of device during startup. Moreover, the ECW assistance exhibits a high tolerance to the impurity and thus ensures a high ramp rate of plasma current even with a high impurity level.
This paper presents experimental research on the use of electron cyclotron waves (ECW) for pre-ionization and assisted start-up in the EAST tokamak. The study demonstrates that ECW can enable plasma breakdown at low electric fields and extend the parameter domain for breakdown. The effect of ECW injection timing, power, and angle on breakdown is investigated, showing that earlier injection and higher power lead to earlier and faster breakdown. The ECW-assisted startup also helps avoid the generation of runaway electrons and improves the safety of the device.