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Integrated reflectometer-interferometer system for plasma density profile measurement

D L Brower, K W Kim, L Zeng, Y Jiang, E J Doyle, W A Peebles1998年Plasma Physics and Controlled FusionIF 2.2出版社

Experimental results are described from an integrated interferometer-reflectometer system implemented on TEXT-Upgrade. In plasma regions where the systems have spatial overlap, excellent agreement is observed between the independently measured electron density profiles. Combined interferometer-reflectometer data are used to obtain the optimal total density profile. By removing chords from the interferometer, one can examine how resolution is compromised as the channel number decreases and spacing varies. Depending on the expected profile shapes (i.e. flat or peaked), one can design an integrated interferometer-reflectometer system employing a minimum number of chords while still providing crucial profile information.

日本語訳

TEXT-Upgradeに実装された統合干渉計・反射計システムからの実験結果について記述する。プラズマ領域において両システムの空間的な重なりがある場合、独立に測定された電子密度分布の間に優れた一致が観測される。統合された干渉計・反射計データを用いることで、最適な全密度分布が得られる。干渉計からチャンネルを除去することにより、チャンネル数が減少し、間隔が変化するにつれて分解能がどのように低下するかを調べることができる。予想される分布形状(すなわち、平坦またはピーク状)に応じて、重要な分布情報を提供しつつ最小限のチャンネル数を採用した統合干渉計・反射計システムを設計することが可能である。

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