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An analysis of VUV C IV emission from the JET divertor giving measurements of electron temperatures

K D Lawson, K M Aggarwal, I H Coffey, F P Keenan, M G OMullane, L Ryć, J Zacks, JET-EFDA Contributors2011年Plasma Physics and Controlled FusionIF 2.2出版社

A description of the radiation emitted by impurities from within a plasma is crucial if spectral line intensities are to be used in detailed studies, such as the analysis of impurity transport. The simplest and most direct check that can be made on measurements of line intensities is to analyse their ratios with other lines from the same ion. This avoids uncertainties in determining the volume of the emitting plasma and the absolute sensitivity calibration of the spectrometer and, in some cases, the need even for accurate measurements of parameters such as electron density. Consistency is required between the measured line intensity ratios and the theoretical values. The expected consistency has not been found for radiation emitted from the JET scrape-off layer (e.g. Lawson et al 2009a JINST4 P04013), meaning that the description of the spectral line intensities of impurity emission from the plasma edge is incomplete. In order to gain further understanding of the discrepancies, an analysis has been carried out for emission from the JET divertor plasma and this is reported in this paper.Carbon was the main low Z intrinsic impurity in JET and an analysis of spectral line intensity ratios has been made for the C IV radiation emitted from the JET divertor. In this case, agreement is found between the measured and theoretical ratios to a very high accuracy, namely to within the experimental uncertainty of ∼±10%. This confirms that the description of the line intensities for the present observations is complete. For some elements and ionization stages, an analysis of line intensity ratios can lead to the determination of parameters such as the electron temperature of the emitting plasma region and estimates of the contribution of recombination to the electron energy level populations. This applies to C IV and, to show the value and possibilities of the spectral measurements, these parameters have been calculated for a database of Ohmic and additionally heated phases of a large number of pulses. The importance of dielectronic, radiative and charge-exchange recombination as well as ionization has been investigated. In addition, the development of Te throughout two example discharges is illustrated. The presented results indicate a number of areas for further investigation.

日本語訳

プラズマ中の不純物から放出される放射の記述は、スペクトル線強度を詳細な研究、例えば不純物輸送の解析に用いる場合に極めて重要である。線強度の測定に対して行える最も簡便かつ直接的な検証は、同じイオン種の他の線との強度比を解析することである。これにより、発光プラズマの体積決定や分光器の絶対感度較正に伴う不確かさ、さらには場合によっては電子密度などのパラメータの正確な測定の必要性も回避できる。測定された線強度比と理論値との間には整合性が要求される。JETのスクレープオフ層から放出される放射については、期待される整合性が見出されていない(例:Lawson et al 2009a JINST4 P04013)。これは、プラズマ端部からの不純物放出のスペクトル線強度の記述が不完全であることを意味する。これらの不一致をさらに理解するため、JETダイバータプラズマからの放射について解析が実施され、本論文で報告される。炭素はJETにおける主要な低Z内在性不純物であり、JETダイバータから放出されるC IV放射についてスペクトル線強度比の解析が行われた。この場合、測定値と理論値の間には、実験誤差範囲内(約±10%)で極めて高い精度の一致が見出された。これは、現在の観測に対する線強度の記述が完全であることを確認するものである。いくつかの元素とイオン化段階については、線強度比の解析により、発光プラズマ領域の電子温度などのパラメータの決定や、電子エネルギー準位の分布に対する再結合の寄与の評価が可能となる。これはC IVに適用され、スペクトル測定の価値と可能性を示すため、これらのパラメータは、多数の放電におけるオーミック加熱相および追加加熱相のデータベースに対して計算された。誘電再結合、放射再結合、荷電交換再結合、ならびに電離の重要性が調査された。さらに、2つの例示的な放電を通じて電子温度の時間発展が示された。提示された結果は、さらなる調査を必要とするいくつかの領域を示唆している。

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