We discuss methods and algorithms of high-temperature laser plasma electron diagnostics based on hard x-ray yield and ionic time-of-flight (TOF) spectra measurements in comparison with the results of direct electronic spectrum recording, with the help of the electrostatic spectrometer. The latter shows clearly the two-component nature of the electron population, arising at femtosecond laser plasma interaction. `Temperatures' of 200 eV and 6 keV for thermal and hot electronic components, correspondingly, were estimated from this measurement. We show that both ionic TOF measurements and double-channel hard x-ray detection allows the assessment of mean hot electron energy in a single laser shot. The former also provides for estimation of the thermal electron temperature and plasma charge state. Good coincidence between the data obtained from the three methods employed is demonstrated. We also describe how to apply our hard x-ray detection method to the case of relativistic laser plasma interaction, where single shot assessment may become even more essential.
我们讨论了基于硬X射线产额和离子飞行时间（TOF）谱测量的高温激光等离子体电子诊断方法，并将其结果与利用静电谱仪直接记录电子谱的结果进行了比较。后者清晰地显示了飞秒激光等离子体相互作用中电子群体的双分量性质。根据该测量，估算出热电子和超热电子的温度分别为200 eV和6 keV。我们证明，离子TOF测量和双通道硬X射线探测均能在单发激光脉冲中评估平均热电子能量。前者还可用于估算等离子体的电子温度和电荷态。三种方法获得的数据具有良好的一致性。我们还描述了如何将我们的硬X射线探测方法应用于相对论性激光等离子体相互作用，在这种情况下，单发评估可能变得更加关键。