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Impurity temperatures measured via line shape analysis in the island scrape-off-layer of Wendelstein 7-X

D Gradic, M Krychowiak, R König, F Henke, M Otte, V Perseo, T Sunn Pedersen, W7-X Team2022年Plasma Physics and Controlled FusionIF 2.2出版社

Impurity temperatures have been determined by a spectroscopic line shape analysis for several species in the divertor scrape-off-layer of the stellarator Wendelstein 7-X (W7-X). Examples include spectral lines from intrinsic elements (C II and C III, He I) as well as from seeded impurities (Ar II, N II) through the divertor gas inlet system. Both Doppler broadening and Zeeman splitting are found to contribute significantly to the impurity line shapes. Zeeman splitting arises due to the confining magnetic field in W7-X and complicates the line shape appearance. By attributing Doppler widths to each of the various Zeeman components, however, we demonstrate that reliable ion temperature values can be derived provided that the presence of the magnetic field is properly accounted for. The spectrally highly resolved lines are analyzed by means of a multi-parameter, least-squares fit routine, which accounts for Doppler broadening, Zeeman splitting, as well as the instrumental broadening of the spectrometer used to measure the spectral line shapes. By spectral fitting of the Zeeman features, it is also found that the line shape analysis can yield values for the local magnetic field, which can be used to localize the impurity radiation approximately provided that the line emission is dominant in a small area intersected by the lines of sight of the spectrometer.

日本語訳

不純物温度は、恒星状装置Wendelstein 7-X(W7-X)のダイバータ・スクレイプオフ層における数種の粒子種について、分光学的な線形状解析により決定された。例としては、固有元素(C IIおよびC III、He I)に加え、ダイバータ・ガス導入口を通して導入されたシード不純物(Ar II、N II)からのスペクトル線が挙げられる。ドップラー広がりとゼーマン分裂の両方が、不純物の線形状に有意に寄与することが見出された。ゼーマン分裂は、W7-Xにおける閉じ込め磁場に起因して生じ、線形状の外観を複雑にする。しかしながら、各ゼーマン成分にドップラー幅を帰属させることにより、磁場の存在を適切に考慮すれば、信頼性の高いイオン温度値が導出可能であることを実証する。スペクトル的に高分解能な線は、ドップラー広がり、ゼーマン分裂、およびスペクトル線形状の測定に用いられる分光器の装置広がりを考慮した多パラメータ最小二乗フィッティングルーチンによって解析される。ゼーマン特徴のスペクトルフィッティングにより、線形状解析から局所磁場の値が得られることも見出され、これは、分光器の視線が交差する小さな領域で線放射が支配的である場合に、不純物放射の位置を近似的に特定するために使用できる。

装置

wendelstein-7x高精度(タイトル一致)

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ImpurityScrape-off layerWendelstein
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