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Initial results from boron powder injection experiments in WEST lower single null L-mode plasmas

G. Bodner, A. Gallo, A. Diallo, R. Lunsford, Ph. Moreau, A. Nagy, F.-P. Pellissier, C. Guillemaut, J.P. Gunn, C. Bourdelle2022年被引用 8Nuclear FusionIF 3出版社

Using a recently installed impurity powder dropper (IPD), boron powder (<150 μm) was injected into lower single null (LSN) L-mode discharges in WEST. IPDs possibly enable real-time wall conditioning of the plasma-facing components and may help to facilitate H-mode access in the full-tungsten environment of WEST. The discharges in this experiment featured Ip = 0.5 MA, BT = 3.7 T, q95 = 4.3, tpulse = 12–30 s, ne,0 ∼ 4 × 1019 m−2, and PLHCD ∼ 4.5 MW. Estimates of the deuterium and impurity particle fluxes, derived from a combination of visible spectroscopy measurements and their corresponding S/XB coefficients, showed decreases of ∼50% in O+, N+, and C+ populations during powder injection and a moderate reduction of these low-Z impurities (∼50%) and W (∼10%) in the discharges that followed powder injection. Along with the improved wall conditions, WEST discharges with B powder injection observed improved confinement, as the stored energy WMHD, neutron rate, and electron temperature Te increased significantly (10%–25% for WMHD and 60%–200% for the neutron rate) at constant input power. These increases in confinement scale up with the powder drop rate and are likely due to the suppression of ion temperature gradient (ITG) turbulence from changes in Zeff and/or modifications to the electron density profile.

日本語訳

最近設置された不純物粉末投入装置(IPD)を用いて、ホウ素粉末(<150 μm)をWEST装置の下部単一零(LSN)Lモード放電に注入した。IPDは、プラズマ対向機器のリアルタイム壁調整を可能にし、WEST装置の全タングステン環境におけるHモード達成を促進する可能性がある。本実験の放電は、Ip = 0.5 MA、BT = 3.7 T、q95 = 4.3、tpulse = 12–30秒、ne,0 ∼ 4 × 1019 m−2、PLHCD ∼ 4.5 MWを特徴とした。可視分光測定と対応するS/X係数の組み合わせから導出された重水素および不純物粒子フラックスの推定値は、粉末注入中にO+、N+、C+の存在量が∼50%減少し、粉末注入後の放電においてこれらの低Z不純物(∼50%)およびW(∼10%)が中程度に減少することを示した。改善された壁状態に加えて、B粉末注入を伴うWEST放電では閉じ込めの改善が観察され、一定の入力電力において蓄積エネルギーWMHD、中性子率、電子温度Teが有意に増加した(WMHDで10%–25%、中性子率で60%–200%)。これらの閉じ込めの増加は粉末投入速度に比例してスケールし、Zeffの変化および/または電子密度分布の修正によるイオン温度勾配(ITG)乱流の抑制に起因する可能性が高い。

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