The stepped fixed frequency X-mode reflectometer operating between 105 and 155 GHz first designed for density fluctuation measurement has been upgraded to also measure the density profile. It runs now with two sources in parallel: a fast swept source and a frequency synthesizer to measure during the same shot the density profile and density fluctuations. The accuracy of the density profile from reflectometry reduces uncertainties on fluctuation profile measurement. This double operating mode also offers two ways to probe MHD modes and the micro-turbulence.