Multiband reflectometry system for density profile measurement with high temporal resolution on JET tokamak

A. Sirinelli, B. Alper, C. Bottereau, F. Clairet, L. Cupido, J. Fessey, C. Hogben, L. Meneses, G. Sandford, M. J. Walsh, JET-EFDA Contributors2010年Review of Scientific InstrumentsIF 1.6 出版社