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Increased understanding of neoclassical internal transport barriers in CHS

T. Minami, A. Fujisawa, H. Iguchi, Y. Liang, K. Ida, S. Nishimura, M. Yokoyama, S. Murakami, Y. Yoshimura, M. Isobe2004年被引用 34Nuclear FusionIF 3出版社

We report recent progress in the study of neoclassical internal transport barriers (N-ITBs) in the compact helical system (CHS) experiment. N-ITBs have been observed in electron cyclotron (EC) heated NBI plasmas. The improved confinement region for electrons is expanded compared with that of previous N-ITB plasmas heated by only EC heating. Moreover, the ion temperature is found to be increased simultaneously by two to three times (Ti(0) ∼ 400–500 eV), with a steep gradient region at ρ ∼ 0.6. From measurement of the averaged peak energy intensity using a soft x-ray CCD camera, it is confirmed that the impurity confinement is also improved with N-ITBs. The radial electric field is observed to bifurcate into ion and electron root (Er ∼ 15 kV m−1), and a rather large electric field shear (dEr/dr ∼ −300 kV m−2) is produced in the layer between ion and electron root.

日本語訳

我々は、コンパクトヘリカルシステム(CHS)実験における新古典内部輸送障壁(N-ITB)の研究の最近の進展を報告する。N-ITBは、電子サイクロトロン(EC)加熱されたNBIプラズマにおいて観測されている。電子の改善された閉じ込め領域は、EC加熱のみによる従来のN-ITBプラズマと比較して拡大している。さらに、イオン温度は同時に2〜3倍(Ti(0) ∼ 400–500 eV)に増加し、ρ ∼ 0.6において急峻な勾配領域が観測される。軟X線CCDカメラを用いた平均ピークエネルギー強度の測定から、不純物閉じ込めもN-ITBによって改善されることが確認された。径方向電場はイオン根と電子根(Er ∼ 15 kV/m)に分岐することが観測され、イオン根と電子根の間の層においてかなり大きな電場シア(dEr/dr ∼ −300 kV/m²)が生成される。

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Transport barrierInternal transport barrierCompact Helical System
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