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Effects of varying stochastic layer on edge plasma and impurity transport in 3D EMC3-EIRENE simulations of LHD

Shuyu Dai, M. Kobayashi, G. Kawamura, Q. Shi, D.Z. Wang2017年Fusion Engineering and DesignIF 1.7出版社

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lhd高精度(タイトル一致)

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ImpurityEdge plasmaLHDImpurity transportEMC3-EIRENE
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